GaN Wafer : Gallium Nitride template on SiC
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  [ Gallium Nitride template on SiC ]

     제조업체 : SCSA
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Untitled Document
Gallium Nitride template on SiC
 

substrate for 
III-V Nitrides Epitaxy

 

Material parameters

Parameter

Value

Typical thickness of GaN, microns

0.2-0.8

Initial substrate

(0001) on axis 6H-SiC or 4H-SiC

Diameter, inch

2

Surface of GaN

As grown

FWHM of X-ray w-scan rocking curve, arcsec

< 250

Concentration Nd – Na cm-3

1017 – 1018

Exclusion area

2 mm periphery region

Contact wafermart

Applications

  • GaN Epitaxial Wafers may be used as substrates for III-V nitride epitaxial growth by MBE, MOCVD and CVD.
  • No buffer layer is required. 
  • GaN Epitaxial Wafers are the ideal substrates for GaN homoepitaxial growth and device manufacturing.

 

Technology
Gallium Nitride Epitaxial Wafer (template) consists of a thin undoped GaN epitaxial layer grown by Hydride Vapor Phase
Epitaxy (HVPE) directly on (0001)Si face on-axis 6H-SiC or 4H-SiC substrate.

 

Additional information

GaN layers and SiC substrates are electrically conducting.  Silicon carbide insures excellent heat removal from nitride
device structure, which is important for high-power devices. GaN/SiC wafers may be cleaved providing mirror-like facets
for nitride laser diodes. 

GaN layers could be grown on SiC substrates supplied by customers.



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